Industry Speaker

Md Itrat Bin Shams

Faculty member EEE, BUET - 2006-1010, Parametric test development engineer - Intel Corporation, USA - 2017-2021 Test R&D Engineer, Intel Corporation, USA - 2021-2025

Title – From Origins to Tomorrow: The Journey of Semiconductor Devices

Abstract:

Electronic devices around us have achieved remarkable progress over the past few decades. From handheld devices to high-performance servers, advancements in semiconductor devices and materials have driven substantial increases in functionality and performance. This talk will highlight the past and present trends of the semiconductor industry and provide insights into the technologies poised to shape its future.

Biography of the Presenter:

Md. Itrat Bin Shams received his B.S. and M.S. degrees from the Department of Electrical and Electronic Engineering (EEE), Bangladesh University of Engineering and Technology (BUET) in 2006 and 2008, respectively. He served as a faculty member in the same department from 2006 to 2010. Dr. Shams earned his Ph.D. in 2017 from the University of Notre Dame, Indiana, USA. He subsequently worked at Intel Corporation as a Parametric Test Development Engineer from 2017 to 2021 and later as a Test R&D Engineer from 2021 to 2025. His research interests include device modeling and characterization. high frequency circuit system development, test methodologies optimization.